OVERVIEW OF ALGORITHMS FOR GRAPHIC PATTERNS RECOGNITION IN IMAGES

Authors

  • Pavlo Serhiienko National Technical University of Ukraine “Igor Sikorsky Kyiv Polytechnic Institute”, Ukraine
  • Mariia Orliva National Technical University of Ukraine “Igor Sikorsky Kyiv Polytechnic Institute”, Ukraine
  • Heorhii Loutskii National Technical University of Ukraine “Igor Sikorsky Kyiv Polytechnic Institute”, Ukraine

Keywords:

FPGA, technical vision, SIFT

Abstract

The article considers the features of technical vision as a process of pattern recognition in images. The review and comparison of characteristic features of actual recognition algorithms, and conclusions about their possibility of realization on FPGA of the average size are carried out. A conclusion is made that the methods based on the scalable feature extraction in the image are perspective ones.

References

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Published

2023-06-08

Issue

Section

Additional Section